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  30 mhz to 4.5 ghz, 45 db rf detector data sheet ADL5506 rev. a document feedback information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specifications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective owners. o ne technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781.329.4700 ?2013C2017 analog devices, inc. all rights reserved. technical support www.analog.com features complete rf detector function typical dynamic range: 45 db frequency range from 30 mhz to 4.5 ghz excellent temperature stability stable linear in decibel response power on/off response time: 65 ns/145 ns (rise/fall) ?5 dbm input power applied operates from ?40c to +85c low power: 3.8 ma at 3.0 v power supply voltage range from 2.5 v to 5.5 v disable current <1 a applications rssi and tssi for wireless terminal devices rf transmitter or receiver power measurement general description the ADL5506 is a complete, low cost subsystem for the measurement of rf signals in the 30 mhz to 4.5 ghz frequency range, with a typical dynamic range of 45 db, intended for use in a wide variety of wireless terminal devices. it provides a wider dynamic range and better accuracy than is possible using discrete diode detectors. in particular, its temperature stability is excellent over ?40c to +85c. its high sensitivity allows measurement of low power levels, thus reducing the amount of power that needs to be coupled to the detector. it is essentially a voltage responding device, with a typical dynamic range of 45 db. for convenience, the signal is internally ac-coupled, using a 5 pf capacitor and a broadband 50 match, with an external shunt resistor of 52 . this high-pass coupling, with a corner at approximately 19 mhz, determines the lowest operating frequency. therefore, the source can be dc grounded. the ADL5506 output increases from approximately 0.14 v to a little over 1 v as the input signal level increases from 1.25 mv rms (?45 dbm) to 224 mv rms (0 dbm). the output is proportional to the logarithm of the input power level; that is, the reading is presented directly in decibels and is scaled about 18 mv/db at 900 mhz. a capacitor can be connected between the vlog pin and the cflt pin when it is desirable to increase the time interval over which averaging of the input waveform occurs. the ADL5506 is available in a 6-ball wlcsp and consumes 3.8 ma from a 3.0 v supply. when powered down, the typical disable supply current is <1 a. functional block diagram figure 1. 10db det 10db det 10db det 10db det det + ? cflt rfin comm offset compensation v-i band-gap reference enbl vpos i-v vlog ADL5506 11768-001
ADL5506* product page quick links last content update: 03/30/2017 comparable parts view a parametric search of comparable parts. evaluation kits ? ADL5506 evaluation board documentation data sheet ? ADL5506: 30 mhz to 4.5 ghz, 45 db rf detector data sheet reference materials press ? analog devices unveils wide dynamic range, highly accurate rf power detectors product selection guide ? rf source booklet design resources ? ADL5506 material declaration ? pcn-pdn information ? quality and reliability ? symbols and footprints discussions view all ADL5506 engineerzone discussions. sample and buy visit the product page to see pricing options. technical support submit a technical question or find your regional support number. document feedback submit feedback for this data sheet. this page is dynamically generated by analog devices, inc., and inserted into this data sheet. a dynamic change to the content on this page will not trigger a change to either the revision number or the content of the product data sheet. this dynamic page may be frequently modified.
ADL5506 data sheet rev. a | page 2 of 2 3 table of contents features .............................................................................................. 1 applications ....................................................................................... 1 general descript ion ......................................................................... 1 functional block diagram .............................................................. 1 revision history ............................................................................... 2 specifications ..................................................................................... 3 absolute maximum ratings ............................................................ 7 esd caution .................................................................................. 7 pin configuration and function descriptions ............................. 8 typical performance characteristics ............................................. 9 measurement setups ...................................................................... 15 theory of operation ...................................................................... 16 applications information .............................................................. 17 basi c connections ...................................................................... 17 transfer function in terms of slope and intercept ............... 17 log conformance error calculation ....................................... 18 evaluation board ............................................................................ 22 land pattern and soldering information ................................ 22 outline dimensions ....................................................................... 23 ordering guide .......................................................................... 23 revision history 3/2017 rev. 0 to rev. a changes to land pattern and soldering information section ........ 22 11/ 20 13 revision 0: initial version
data sheet ADL5506 rev. a | page 3 of 23 specifications v pos = 3 .0 v, t a = 25c, unless otherwise noted. table 1 . parameter test conditions /comments min typ max unit signal input interface pin rfin frequency range 30 to 4500 mhz input voltage range internally ac - coupled 1.25 to 400 mv rms equivalent power range 52.3 external termination ? 45 to + 5 dbm input resistance 1 f = 0.1 ghz, 52.3 shunt resistor at rfin 50 output interface pin vlog output offset voltage no signal at rfin, r l 10 k 0.14 v maximum output voltage transient during e nable sequencing 2.25 v available output current sourcing/sinking 4/1 ma rise time p in = off to ? 5 dbm, 1 0% to 9 0% 65 ns fall time p in = ? 5 dbm to off, 9 0% to 1 0% 145 ns residual rf (at twice the input frequency ) f = 0.1 ghz 50 v output noise rf input = 1900 mhz, ?10 dbm, f noise = 100 khz, c flt = open 175 nv/hz enable interface pin enbl logic level to enable power high condition, ? 40 c t a +85 c 1. 2 v pos v input current w hen high 2.7 v at enbl, ? 40 c t a +85 c < 1 a logic level to disable power low condition, ? 40 c t a +85 c 0 0.5 v power interface pin vpos supply voltage 2.5 3.0 5.5 v quiescent current 3. 8 ma vs. temperature ? 40c t a +85c 4.6 ma
ADL5506 data sheet rev. a | page 4 of 23 parameter test conditions /comments min typ max unit logarithmic slope calibration at ?30 dbm and ?5 dbm 17.8 mv/db logarithmic intercept calibration at ? 30 dbm and ?5 dbm ? 51. 5 dbm output voltage high power input p in = ?5 dbm 821 mv output voltage low power input p in = ?30 dbm 380 mv 100 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 46 db maximum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm 2 dbm minimum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm ? 44 dbm deviation vs. temperature deviation from output at 25c, 3 v ? 40c < t a < +85c; p in = ?30 dbm +0.15/ ? 0.5 2 db ? 40c < t a < +85c; p in = ?10 dbm +0.7/?0.9 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 17.7 mv/db logarithmic intercept calibration at ? 30 dbm and ?10 dbm ? 53.7 dbm output vol tage high power input p in = ?10 dbm 774 mv output voltage low power input p in = ?30 dbm 420 mv 450 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 45 db maximum input level, 1.0 db three - point calibration at ?4 0 dbm , ? 30 dbm, and ? 8 dbm 1 dbm minimum input level, 1.0 db three - point calibration at ?4 0 dbm , ? 30 dbm, and ? 8 dbm ? 44 dbm deviation vs. temperature deviation from output at 25c, 3 v ? 40c < t a < +85c; p in = ?30 dbm +0.3/?0.5 2 db ? 40c < t a < +85c; p in = ?10 dbm +0.6/?0.9 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 18.4 mv/db logarithmic intercept calibration at ? 30 dbm and ?10 dbm ? 53.2 dbm output voltage high power input p in = ?10 dbm 797 mv output voltage low power input p in = ?30 dbm 428 mv 900 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 45 db maximum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm 1 dbm minimum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm ? 44 dbm deviation vs. temperature deviation from output at 25c, 3 v ? 40c < t a < +85c; p in = ?30 dbm +0.3/ ? 0.5 2 db ? 40c < t a < +85c; p in = ?10 dbm +0.6/?0.8 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 18.2 mv/db logarithmic intercept calibration at ? 30 dbm and ?10 dbm ? 54 dbm output voltage high power input p in = ?10 dbm 798 mv output voltage low power input p in = ?30 dbm 435 mv
data sheet ADL5506 rev. a | page 5 of 23 parameter test conditions /comments min typ max unit 1900 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 46 db maximum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm 2 dbm minimum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm ? 44 dbm deviation vs. temperature deviation from output at 25c, 3 v ? 40c < t a < +85c; p in = ?30 dbm +0.1/?0.4 2 db ? 40c < t a < +85c; p in = ?10 dbm +0.2/?0.7 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 17.5 mv/db logarithmic intercept calibration at ? 30 dbm and ?10 dbm ? 55.5 dbm output voltage high power input p in = ?10 dbm 797 mv output voltage low power input p in = ?30 dbm 446 mv 2140 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 4 5 db maximum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm 1 dbm minimum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm ? 44 dbm deviation vs. temperature deviation from output at 25c, 3 v ? 40c < t a < +85c; p in = ?30 dbm +0.1/?0.5 2 db ? 40c < t a < +85c; p in = ?10 dbm +0.2/?0.7 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 17.5 mv/db logarithmic intercept calibration at ? 30 dbm and ?10 dbm ? 56 dbm output voltage high power input p in = ?10 dbm 800 mv output voltage low power input p in = ?30 dbm 450 mv 2700 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 46 db maximum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm 1 dbm minimum input level, 1.0 db three - point calibration at ?40 dbm , ? 30 dbm, and ? 10 dbm ? 45 dbm deviation vs. temperature deviation from output at 25c, 3 v ? 40c < t a < +85c; p in = ?30 dbm +0.2/ ? 0.7 2 db ? 40c < t a < +85c; p in = ?10 dbm +0.3/ ? 0.9 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 17.5 mv/db logarithmic intercept calibration at ? 30 dbm and ?10 dbm ? 57 dbm output voltage high power input p in = ? 10 dbm 808 mv output voltage low power input p in = ?30 dbm 461 mv 3500 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 45 db maximum input level, 1.0 db three - point calibration at ?42 dbm , ? 30 dbm, and ? 10 dbm 1 dbm minimum input level, 1.0 db three - point calibration at ?42 dbm , ? 30 dbm, and ? 10 dbm ? 44 dbm deviation vs. temperature deviation from output at 25c, 3 v ? 40c < t a < +85c; p in = ?30 dbm +0.1 /? 1.1 2 db ? 40c < t a < +85c; p in = ?10 dbm +0.2/ ? 1 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 17.2 mv/db logarithmic intercept calibration at?30 dbm and ?10 dbm ? 55 dbm output voltage high power input p in = ?10 dbm 773 mv output voltage low power input p in = ?30 dbm 430 mv
ADL5506 data sheet rev. a | page 6 of 23 parameter test conditions /comments min typ max unit 4500 mhz 1.0 db dynamic range continuous wave (cw) input, t a = 25c 42 db maximum input level, 1.0 db three - point calibration at ?35 dbm , ? 30 dbm, and ? 10 dbm 3 dbm minimum input level, 1.0 db three - point calibration at ?35 dbm , ? 30 dbm, and ? 10 dbm ? 39 dbm deviation vs. temperature deviation from output at 25c, 3 v t a = ?40c ; p in = ? 30 dbm ? 3.2 db 0c < t a < 85c; p in = ? 30 dbm +0.5/ ? 0.8 2 db t a = ?40c ; p in = ? 10 dbm ? 3.1 db 0c < t a < 85c; p in = ? 10 dbm +0.1/ ? 0.7 2 db logarithmic slope calibration at ?30 dbm and ?10 dbm 16.7 mv/db logarithmic intercept calibration at ? 30 dbm and ?10 dbm ? 50 dbm output voltage high power input p in = ?10 dbm 684 mv output v oltage low power input p in = ?30 dbm 350 mv 1 see figure 32. 2 the slash indicates a range. for example, +0.9/?0.6 means +0.9 to ?0.6.
data sheet ADL5506 rev. a | page 7 of 23 absolute maximum ratings table 2. parameter rating supply voltage, vpos 5.5 v rf input power, rfin 1, 2 15 dbm equivalent voltage, sine wave input 1.25 v rms internal power dissipation 75 mw ja (wlcsp) 260c/w maximum junction temperature 145c operating temperature range ?40c to +85c storage temperature range ?65c to +150c 1 driven from a 50 source. 2 under 50 input matched condition. stresses at or above those listed under absolute maximum ratings may cause permanent damage to the product. this is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. operation beyond the maximum operating conditions for extended periods may affect product reliability. esd caution
ADL5506 data sheet rev. a | page 8 of 23 pin configuration and fu nction descriptions figure 2. pin configuration table 3. pin function descriptions pin no. mnemonic description 1 cflt connection for an external capacitor, cflt, to reduce th e modulation content from the output voltage. it also slows the response of the output and reduces the noise s een on the output. the capacitor is connected between cflt and vlog. see the filter capacitor section for choosing the correct cflt value. 2 vpos positive supply. the positive supply voltage (v pos ) range is from 2.5 v to 5.5 v. us e decoupling capacitors near this pin on the printed circuit board. 3 rfin rf input. 5 pf ac coupling capacitor on chip. connect a 52.3 shunt resistor near this pin for broadband 50 match. see the input coupling options section for more matching options. 4 comm device common (ground). connect this pin to system ground using a low impedance path. 5 vlog logarithmic output. the output voltage (v log ) increases with increasing in put amplitude. the output is proportional to the logarithm of the input signal level. 6 enbl device enable. connect the enbl pin to a logic high (1.2 v to v pos ) to enable the device. connect the enbl pin to a logic low (0 v to 0.5 v) to disable the device. 1 cflt 6 enbl 2 vpos 5 vlog 3 rfin 4 comm a dl5506 top view (ball side down) not to scale 11768-002
data sheet ADL5506 rev. a | page 9 of 23 typical performance characteristics vp o s = 3 v, t a = + 25c (black), + 85c (red) , 0c (green) , and ? 40c (dark blue) where appropriate. c f lt = open , unless otherwise noted. input rf signal is a sine wave (cw), unless otherwise indicated. error referred to slope and intercept at indicated ca libration points at 25c. power ref erenced to 50 ? source and with a 52.3 ? shunt matching resistor on the board . distribution plots based upon more than 50 devices . figure 3. typical v log vs. p in over f requenc y at 25c figure 4. quiescent supply current vs. temperature , 2.5 v to 5.5 v supply voltage figure 5. log conformance error vs. p in over supply voltage and temperature at 900 mhz figure 6. typical v log vs . f requency for five rf input levels at 25c figure 7. log conformance error vs. p in over supply voltage and temperature at 100 mhz figure 8. log conformance error vs. p in over supply voltage and temperature at 19 00 mhz 10 0 ?10 ?20 ?30 ?40 ?50 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 p in (dbm) output vo lt age (v) 30mhz 50mhz 100mhz 450mhz 900mhz 1900mhz 2140mhz 2700mhz 3500mhz 4500mhz 1 1768-003 120 100 80 60 40 20 0 ?20 ?40 5.5 5.0 4.5 4.0 3.5 3.0 2.5 temper a ture ( c) supp l y current (ma) v pos = 2.5v v pos = 3.0v v pos = 5.0v v pos = 5.5v 1 1768-004 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) error (db) three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm 2.7 v , 3 v , and 3.3v on t op of each other v pos = 2.5v a t ?4 0 c v pos = 2.5v a t +2 5 c v pos = 2.5v a t +8 5 c v pos = 3.0v a t ?4 0 c v pos = 3.0v a t +2 5 c v pos = 3.0v a t +8 5 c v pos = 5.0v a t ?4 0 c v pos = 5.0v a t +2 5 c v pos = 5.0v a t +8 5 c v pos = 5.5v a t ?4 0 c v pos = 5.5v a t +2 5 c v pos = 5.5v a t +8 5 c 1 1768-005 1000 100 10 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 frequenc y (mhz) output vo lt age (v) ?5dbm ?15dbm ?25dbm ?35dbm ?45dbm 1 1768-006 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) error (db) three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm 2.7 v , 3 v , and 3.3v on t op of each other v pos = 2.5v a t ?4 0 c v pos = 2.5v a t +2 5 c v pos = 2.5v a t +8 5 c v pos = 3.0v a t ?4 0 c v pos = 3.0v a t +2 5 c v pos = 3.0v a t +8 5 c v pos = 5.0v a t ?4 0 c v pos = 5.0v a t +2 5 c v pos = 5.0v a t +8 5 c v pos = 5.5v a t ?4 0 c v pos = 5.5v a t +2 5 c v pos = 5.5v a t +8 5 c 1 1768-007 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) error (db) three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm 2.7 v , 3 v , and 3.3v on t op of each other v pos = 2.5v a t ?4 0 c v pos = 2.5v a t +2 5 c v pos = 2.5v a t +8 5 c v pos = 3.0v a t ?4 0 c v pos = 3.0v a t +2 5 c v pos = 3.0v a t +8 5 c v pos = 5.0v a t ?4 0 c v pos = 5.0v a t +2 5 c v pos = 5.0v a t +8 5 c v pos = 5.5v a t ?4 0 c v pos = 5.5v a t +2 5 c v pos = 5.5v a t +8 5 c 1 1768-008
ADL5506 data sheet rev. a | page 10 of 23 figure 9. v log and log conformance error vs. p in over temperature at 30 mhz figure 10 . v log and log conformance error vs. p in over temperature at 50 mhz figure 11 . v log and log conformance error vs. p in over temperature at 100 mhz figure 12 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 30 mhz figure 13 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 50 mhz figure 14 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 100 mhz 10 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) ?40c 0c +25c +85c three-point calibr a tion a t ?35dbm, ?25dbm, and ?5dbm 1 1768-010 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) three-point calibr a tion a t ?35dbm, ?25dbm, and ?5dbm ?40c 0c +25c +85c 1 1768-0 1 1 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm ?40c 0c +25c +85c 1 1768- 11 1 10 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 p in (dbm) output vo lt age (v) drift (db) calibr a tion a t ?30dbm and ?5dbm ?40c 0c +25c +85c 1 1768-012 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) calibr a tion a t ?30dbm and ?5dbm ?40c 0c +25c +85c 1 1768-013 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) calibr a tion a t ?30dbm and ?10dbm t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 1 1768- 1 14
data sheet ADL5506 rev. a | page 11 of 23 figure 15 . v log and log conformance error vs. p in over temperature at 450 mhz figure 16 . v log and log conformance error vs. p in over temperature at 900 mhz figure 17 . v log and log conformance error vs. p in over temperature a t 1900 mhz figure 18 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 450 mhz figure 19 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 900 mhz figure 20 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 1900 mhz 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 1 1768- 1 15 three-point calibr a tion a t ?40dbm, ?30dbm, and ?8dbm 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 output vo lt age (v) error (db) three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm p in (dbm) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 1 1768- 1 16 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 output vo lt age (v) error (db) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm p in (dbm) 1 1768- 1 17 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) calibr a tion a t ?30dbm and ?10dbm t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 1 1768- 1 18 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c calibr a tion a t ?30dbm and ?10dbm 1 1768- 1 19 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c calibr a tion a t ?30dbm and ?10dbm 1 1768-120
ADL5506 data sheet rev. a | page 12 of 23 figure 21 . v log and log conformance error vs. p in over temperature at 2140 mhz figure 22 . v log and log conformance error vs. p in over temperature at 2700 mhz figure 23 . v log and log conformance error vs. p in over temperature at 3500 mhz figure 24 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 2140 mhz figure 25 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 2700 mhz figure 26 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 3500 mhz 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm 1 1768-121 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) three-point calibr a tion a t ?40dbm, ?30dbm, and ?10dbm 1 1768-122 t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 output vo lt age (v) error (db) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c p in (dbm) 1 1768-123 three-point calibr a tion a t ?42dbm, ?30dbm, and ?10dbm 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) calibr a tion a t ?30dbm and ?10dbm t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 1 1768-124 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) calibr a tion a t ?30dbm and ?10dbm t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 1 1768-125 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) 1 1768-126 calibr a tion a t ?30dbm and ?10dbm t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c
data sheet ADL5506 rev. a | page 13 of 23 figure 27 . v log and log conformance error vs. p in over temperature at 4500 mhz figure 28 . output response to gating on enbl pin for various rf input levels, carrier frequency = 900 mhz, c flt = open (see figure 39 in the measurement setups section) figure 29 . output response to rf burst input for various rf input levels, carrier frequency = 1 00 mhz, c flt = open (see figure 40 in the measurement setups section) figure 30 . distribution of log conformance error with respect to v log at 25c vs. p in and temperature at 4500 mhz figure 31 . noise spectral density, c flt = open, 25c figure 32 . s 11 at rf input port, 10 mhz to 4.5 ghz with 52.3 ? shunt resistor at rf input port 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 1 1768-127 three-point calibr a tion a t ?35dbm, ?30dbm, and ?10dbm 1 1768-133 0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 ?4 ?2 0 2 4 6 8 10 12 14 16 output vo lt age (v) time (s) enable pulse 0dbm ?10dbm ?20dbm ?30dbm ?40dbm rf pulse g a ting 0dbm ?10dbm ?20dbm ?30dbm ?40dbm 1 1768-129 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 ?0.5 ?0.3 ?0.1 0.1 0.3 0.5 0.7 0.9 1.1 1.3 1.5 output vo lt age (v) time (s) 5 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) drift (db) 1 1768-130 calibr a tion a t ?30dbm and ?10dbm t a = ?4 0 c t a = 0 c t a = +2 5 c t a = +8 5 c 0 50 100 150 200 250 300 350 400 450 500 10k 100k 1m 10m noise spectra l densit y (nv/hz) frequenc y (hz) 1 1768-016 0dbm ?10dbm ?20dbm ?30dbm ?40dbm ?50dbm ?60dbm no signa l 4 3 2 1 0 0 ? 5 ?1 0 ?1 5 ?2 0 ?2 5 ?3 0 ?3 5 f r eq u en c y (g h z) s 1 1 (d b ) 1 1768 - 041
ADL5506 data sheet rev. a | page 14 of 23 figure 33 . distribution of v log at 900 mhz, 25c, p in = ?30 dbm figure 34 . distribution of intercept at 900 mhz, 25c figure 35 . error from cw linear reference vs. signal modulation ( four - carrier w - cdma, lte tm1 one - carrier 20 mhz, one - carrier w - cdma, 16 qam, 64 qam, qpsk ), frequency = 100 mhz figure 36 . distribution of v log at 900 mhz, 25c, p in = ?6 dbm figure 37 . distribution of slope at 900 mhz, 25c figure 38 . error from cw linear reference vs. signal modulation ( four - carrier w - cdma, lte tm1 one - carrier 20 mhz, one - carrier w - cdma, 16 qam, 64 qam, qpsk), frequency = 2.14 ghz 14000 12000 10000 8000 6000 4000 2000 0 300 400 500 600 output vo lt age (mv) count 1 1768-034 intercept (dbm) ?65 ?60 ?50 ?45 ?55 15000 18000 12000 9000 6000 3000 0 count 1 1768-038 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) cw 4-carrier w -cdm a pe p = 12.08db l te tm1 1-carrier 20mhz pe p = 1 1.58db 1-carrier w -cdm a pe p = 10.56db 16 qam pe p = 6.34db 64 qam pe p = 7.17db qpsk pe p = 3.8db three point calibr a tion a t ?40dbm, ?30dbm and ?10dbm 1 1768-040 800 850 900 950 1000 1050 1 100 output vo lt age (mv) 12000 10000 8000 6000 4000 2000 0 count 1 1768-037 14000 16000 12000 10000 8000 6000 16 17 slope (mv/db) 18 19 20 4000 2000 0 count 1 1768-035 0 ?5 ?10 ?15 ?20 ?25 ?30 ?35 ?40 ?45 ?50 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output vo lt age (v) error (db) cw 4-carrier w -cdm a pe p = 12.08db l te tm1 1-carrier 20mhz pe p = 1 1.58db 1-carrier w -cdm a pe p = 10.56db 16 qam pe p = 6.34db 64 qam pe p = 7.17db qpsk pe p = 3.8db three point calibr a tion a t ?40dbm, ?30dbm and ?10dbm 1 1768-042
data sheet ADL5506 rev. a | page 15 of 23 measurement setups figure 39. hardware configuration for output response to enbl pin gating measurements figure 40. hardware configuration for output response to rf pulse input measurements rohde & schwarz signal generator smr40 ADL5506 evaluation board pulse in rf out rfin vpos enbl 1m ? trigger vlog hp e3631a power supply agilent 33522a function/arbitrary waveform generator ch2 ch1 tektronix digital phosphor oscilloscope tds5104 11768-031 rohde & schwarz signal generator smr40 ADL5506 evaluation board pulse in rf out rfin 1m ? trigger vlog agilent 33522a function/arbitrary waveform generator ch2 ch1 tektronix digital phosphor oscilloscope tds5104 vpos enbl 11768-036 hp e3631a power supply
ADL5506 data sheet rev. a | page 16 of 23 theory of operation the ADL5506 is a logarithmic detector (log amp), based on the principle of successive compression. it is similar in design to the ad8312 and is fabricated on an advanced bicmos process. it comes in a smaller 0.8 mm 1.2 mm wlcsp package and offers 4.5 ghz rf bandwidth. figure 41 shows the main features of the ADL5506 in block schematic form. the ADL5506 combines two key functions needed for the measurement of signal level over a moderately wide dynamic range. first, it provides the amplification needed to respond to small signals in a chain of four amplifier/limiter cells, each having a small signal gain of 10 db and a bandwidth of approximately 4.5 ghz. at the output of each amplifier stage is a full wave rectifier, essentially a square law detector cell that converts the rf signal voltages to a fluctuating current with an average value that increases with signal level. a further passive detector stage is added preceding the first stage. therefore, there are five detectors, each separated by 10 db, spanning about 50 db of dynamic range. the overall accuracy at the extremes of this total range, viewed as the deviation from an ideal logarithmic response, that is, the log conformance error, can be judged by referencing figure 5, figure 7, and figure 8, which show that errors across the central 40 db are moderate. these figures show how the conformance to an ideal logarithmic function varies with temperature, frequency, and supply voltage. the output of these detector cells is in the form of a differential current, making their summation a simple matter. it can easily be shown that such summation closely approximates a logarithmic function. this result is then converted to a voltage at the vlog pin through a high gain stage. this output is connected back to a voltage-to-current (v-to-i) stage, in such a manner that v log is a logarithmic measure of the rf input voltage with a slope and intercept controlled by the design. for a fixed termination resistance at the input of the ADL5506 , a given voltage corresponds to a certain power level. the external termination added before the ADL5506 determines the effective power scaling. this often takes the form of a simple resistor (52.3 provides a net 50 input), but more elaborate matching networks can be used. this impedance determines the logarithmic intercept, the input power for which the output crosses the baseline (v log = 0 v) if the function were continuous for all values of input. because this is never the case for a practical log amp, the intercept refers to the value obtained by the minimum error, straight line fit to the actual graph of v log vs. input power. the quoted values in table 1 assume a sinusoidal (cw) signal. where there is complex modulation, as in cdma, the calibration of the power response needs to be adjusted accordingly. where a true power (waveform independ- ent) response is needed, consider the use of an rms responding detector, such as the adl5504 . however, in terms of the logarithmic slope, the amount by which the output v log changes for each decibel of input change (voltage or power), is, in principle, independent of waveform or termination impedance. in practice, it usually falls off at higher frequencies because of the declining gain of the amplifier stages and other effects in the detector cells. for the ADL5506 , the slope at 30 mhz is 18.8 mv/db and falls slightly as frequency increases to about 16.7 mv/db at 4.5 ghz. these values are sensibly independent of temperature and almost completely unaffected by supply voltages of 2.7 v to 5.5 v. figure 41. bl ock schematic 10db det 10db det 10db det 10db det det + ? cflt rfin comm offset compensation v-i band-gap reference enbl vpos i-v vlog ADL5506 11768-045
data sheet ADL5506 rev. a | page 17 of 23 applications information basic connections figure 42 shows the basic connections for measurement mode. a supply voltage of 2.5 v to 5.5 v is required. decouple the supply to the vpos pin with a low inductance 0.1 f surface- mount ceramic capacitor. a series resistor of about 10 can be added; this resistor slightly reduces the supply voltage to the ADL5506 and depends on the load resistance at the output to ground. avoid its use in applications where the power supply voltage is very low. a series inductor provides similar power supply filtering with minimal drop in supply voltage. figure 42. basic connections the ADL5506 has an internal input coupling capacitor. this eliminates the need for external ac coupling. in this example, a broadband input match is achieved by connecting a 52.3 resistor between rfin and ground. this resistance combines with the internal input impedance to give an overall broadband input resistance of 50 . several other coupling methods are possible; these are described in the input coupling options section. ensure that the load resistance on v log is not lower than 600 so that the full-scale output can be generated with the limited available sourcing current of 4 ma. figure 43 shows the logarithmic conformance under the same conditions. figure 43. v log and log conformance error vs. input level at 900 mhz transfer function in terms of slope and intercept the transfer function of the ADL5506 is characterized in terms of its slope and intercept. the logarithmic slope is defined as the change in the rssi output voltage for a 1 db change at the input. for the ADL5506 , the slope is nominally 18 mv/db. therefore, a 10 db change at the input results in a change at the output of approximately 180 mv. figure 43 shows the range over which the device maintains its constant slope. the dynamic range can be defined as the range over which the error remains within a certain band, usually 1 db or 3 db. in figure 43 for example, the 1 db dynamic range is approximately 46 db (from ?44 dbm to +2 dbm). the intercept is the point at which the extrapolated linear response intersects the horizontal axis (see figure 43). using the slope and intercept, calculate the output voltage for any input level within the specified input range, or calculate the input level from the output voltage by the following complementary equations: v log = v slope ( p in C p o ) p in = ( v log / v slope ) + p o where: v log is the demodulated and filtered rssi output, in v. v slope is the logarithmic slope, expressed in v/db. p in is the input signal, expressed in decibels relative to some reference level (dbm in this case). p o is the logarithmic intercept, expressed in decibels relative to the same reference level. for example, at an input level of ?27 dbm, the v log output voltage is v log = 0.018 v/db [?27 dbm ?(?56 dbm)] = 0.522 v v log v pos ADL5506 enbl 1 vlog 2 comm 3 cftl 6 vpos 5 rfin 4 v pos input 52.3 ? 0 . 1 f 1 0 0 p f n c 11768-046 11768-223 50 ?5?10?15?20?25?30 ?35 ?40?45?50?55?60 1.2 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 6 5 4 3 2 1 0 ?1 ?2 ?3 ?4 ?5 ?6 p in (dbm) output voltage (v) error (db) error intercept v l o g 3db dynamic range 1db dynamic range
ADL5506 data sheet rev. a | page 18 of 23 log conformance error calculation log conformance error is expressed in terms of the deviation in the output voltage between the measured v log and the v log calculated with an ideal log transformation function. ideally, the measured v log output at a particular input power, as plotted in figure 44, must not deviate from the calculated value of v log at that same input power. setting the measured v log to the right side of the preceding equation and rearranging yields 0 )( ??? oin slope in measured log pp v p v in actuality, this does not always calculate to zero. the finite calculation that results is the log conformance error, as follows: 0 )( )( ??? ? oin slope in measured log in pp v p v perror where error is in db. when more than two calibration points are chosen to compute the error, the error computation must be done in a piece-wise fashion. for the ADL5506 , three calibration points were chosen in characterization to compute the log conformance error of the ADL5506 . for example, one set of calibration points used was ?40 dbm, ?30 dbm, and ?10 dbm. with three calibration points, two regions of error are computed, region a and region b (see figure 45) to compute the error, first compute two slopes and two intercepts: one slope and intercept for region a and the other slope and intercept for region b. note that the error is zero at each calibration point. in1 in2 log1 log2 aslope pp vv v ? ? ? _ in2 in3 log2 log3 bslope pp vv v ? ? ? _ next, find the two intercepts. (the two intercept points can be computed with the same calibration points, middle point for both, with the slope being different for the two intercept points.) in2 aslope log ao p v v p ? ? _ 2 _ 3 _ 3 _ in bslope log bo p v v p ? ? figure 44. v log vs. p in the log conformance error for region a, which is from the low end of the input power range to p in2 is as follows: aoin aslope inlog ina pp v pv perror _ _ )( )( ?? ? the log conformance error for region b, which is from p in2 to the upper end of the input power range is as follows: boin bslope inlog inb pp v pv perror _ _ )( )( ?? ? figure 45. error vs. p in for four calibration points, there are three regions of error computed. filter capacitor the video bandwidth of v log is approximately 3.5 mhz. in cw applications where the input frequency is much higher than this, no further filtering of the demodulated signal is required. where there is a low frequency modulation of the carrier amplitude, however, reduce the low-pass corner by the addition of an external filter capacitor, c flt . the video bandwidth is related to c flt by ?? f c bandwidth video ??? ? pf5.3k ? 132 1 ? (p in1 , v log1 ) 0 0.2 0.4 0.6 0.8 1.0 1.2 ? 50 ? 45 ? 40 ? 35 ?3 0 ? 25 ? 20 ? 15 ? 10 ? 50 5 output voltage (v) p in (dbm) v log v log calculated (p in2 , v log2 ) (p in3 , v log3 ) 11768-224 ?3 ?2 ?1 0 1 2 3 ?50 ?45 ?40 ?35 ?30 ?25 ?20 ?15 ?10 ? 50 5 error (db) p in (dbm) 11768-225 region b region a
data sheet ADL5506 rev. a | page 19 of 23 input coupling options the internal 5 pf coupling capacitor of the ADL5506 , along with the low frequency input impedance of 1.7 k, gives a high- pass input corner frequency of approximately 19 mhz. this sets the minimum operating frequency. figure 46 to figure 48 show three options for input coupling. a broadband resistive match can be implemented by connecting a shunt resistor to ground at rfin (see figure 46). this 52.3 resistor (other values can also be used to select different overall input impedances) combines with the input impedance of the ad5506 to give a broadband input impedance of 50 . while the input resistance and capacitance (r in and c in ) varies by a maximum of approximately 20% from device to device, the dominance of the external shunt resistor means that the variation in the overall input impedance is close to the tolerance of the external resistor. achieve better return loss by placing the 52.3 shunt resistor as near the device under test (dut) as possible. a reactive match can also be implemented, as shown in figure 47. this is not recommended at low frequencies because device tolerances dramatically vary the quality of the match due to the large input resistance. for low frequencies, the option shown in figure 46 or figure 48 is recommended. in figure 47, the matching components are drawn as general reactances. depending on the frequency, the input impedance at that frequency and the availability of standard value components, either a capacitor or an inductor, is used. as in the previous case, the input impedance at a particular frequency is plotted on a smith chart and matching components are chosen (shunt or series l, or shunt or series c) to move the impedance to the center of the chart. matching components for specific frequencies can be calculated using the smith chart (see figure 17). table 4 outlines the input impedances for some commonly used frequencies. the impedance matching characteristics of a reactive matching network provide voltage gain ahead of the ADL5506 , which increases device sensitivity (see table 4). the voltage gain is calculated by r1 r2 gain voltage db 10 log20 ? where: r2 is the input impedance of the ADL5506 . r1 is the source impedance to which the ADL5506 is being matched. note that this gain is only achieved for a perfect match. component tolerances and the use of standard values tend to reduce gain. figure 46. broadband resistive method for input coupling figure 47. narrow-band reactive method for input coupling figure 48. series attenuation method for input coupling figure 48 shows a third method for coupling the input signal into the ADL5506 in applications where the input signal is larger than the input range of the log amp. a series resistor, connected to the rf source, combines with the input impedance of the ADL5506 to resistively divide the input signal being applied to the input. this has the advantage of very little power being tapped off in rf power transmission applications. table 4. input impedance with 52.3 shunt for select frequency frequency s 11 impedance (ghz) real imaginary (series) 0.05 +0.0023 ?0.031 50.14 ? j3.10 0.1 ?0.014 ?0.033 48.48 ? j3.21 0.9 ?0.144 +0.007 37.37 ? j0.51 1.9 ?0.052 +0.282 38.66 ? j23.73 2.2 +0.074 +0.329 45.89 ? j34.09 2.5 +0.233 +0.312 61.85 ? j45.48 3.0 +0.467 +0.096 131.91 ? j32.64 3.5 +0.394 ?0.305 81.58 ? j66.25 table 5. raw input impedance for select frequency frequency s 11 impedance (ghz) real imaginary (series) 0.1 +0.838 ?0.251 131.9 ? j281.59 0.9 ?0.206 +0.714 11.41 ? j36.33 1.9 ?0.571 +0.397 9.84 + j15.11 2.2 ?0.284 +0.639 12.42 + j31.05 2.5 +0.077 +0.699 18.87 ? j52.17 3.0 +0.564 +0.407 72.70 + j114.52 3.5 +0.602 ?0.099 186.70 ? j58.55 rfin ADL5506 v bias c in c c r in 11768-048 ADL5506 50 ? source rfin x2 x1 v bias c in c c r in 50 ? 11768-049 rfin stripline ADL5506 v bias c in c c r in r attn 11768-050
ADL5506 data sheet rev. a | page 20 of 23 effect of waveform type on intercept although specified for input levels in decibels relative to 1 mw (dbm), the ADL5506 fundamentally responds to voltage and not to power. a direct consequence of this characteristic is that input signals of equal rms power but differing crest factors, produce different results at the output of the log amplifier. the effect of differing signal waveforms is to shift the effective value of the intercept upwards or downwards. graphically, this looks like a vertical shift in the transfer function of the log amplifier. the logarithmic slope, however, is not affected. fo r example, consider the case of the ADL5506 being alternately fed by an unmodulated sine wave and by a 64 qam signal of the same rms power. the output voltage of the ADL5506 differs by the equivalent of 1.6 db (31 mv) over the complete dynamic range of the device (with the output for a 64 qam input being lower). figure 35 and figure 38 shows the transfer function of the ADL5506 when driven by both an unmodulated sine wave and several different signal waveforms. for precision operation, calibrate the ADL5506 for each signal type that is driving it. to measure the rms power of a 64 qam inpu t, for example, add the millivolt equivalent of the decib el value of the intercept shift ( 18.5 mv/db 1. 5 db) to the output voltage of the ADL5506 . temperature drift at high frequencies figure 23 and figure 27 show the log slope and error over temperature for a 3.5 ghz and 4.5 ghz input signal , respectively . error due to drift over temperature consistently remains within 0.5 db for a temperature r ange of 0 c to 85 c . temperatures below 0 c begin to exhibit error beyond 0.5 db with error becoming no worse than ? 3 db typical at ? 4 0 c. for all frequ encies using a reduced temperature range, higher measurement accuracy is achievable. operation above 4 .5 ghz the ADL5506 works at high frequencies but exhibits slightly higher output voltage temperature drift , especially at cold temperatures as described in the temperature drift at high frequencies section. figure 49 and figure 50 show v log vs. p in over frequency from 30 m hz to 6 ghz. the ADL5506 exhibits a significant intercept shift, high power ripple , and a continued decrease of the slope , which all contribute to a decrease in dynamic range. the changes in performance that occur as frequency is increased is partly due to less energy transferring into the device and partly to the bandwidth limitation of the limiting amplifier stages. figure 49 . v log vs. p in over frequency (30 mhz to 4500 mhz) figure 50 . v log vs. p in over frequency (4.5 g hz to 6 ghz) 10 0 ?10 ?20 ?30 ?40 ?50 1.1 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 p in (dbm) output vo lt age (v) 30mhz 50mhz 100mhz 450mhz 900mhz 1900mhz 2140mhz 2700mhz 3500mhz 4500mhz 1 1768-051 10 0 ?10 ?20 ?30 ?40 ?50 1.2 1.0 0.8 0.6 0.4 0 0.2 p in (dbm) output vo lt age (v) 1 1768-151 4.5ghz 5ghz 5.5ghz 6ghz
data sheet ADL5506 rev. a | page 21 of 23 v log output noise the ADL5506 v log output noise is shown in figure 31 in the typical performance characteristics section for capacitor c flt = open. placing capacitance from cflt to vlog decrease s the noise spectral den sity and the integrated noise. the choice of the c flt value depend s on the requirements pertaining to integrated noise and noise spectral density at a given frequency . also, the value of c flt directly controls the video bandwidth of the output, and thus controls the output response time to a n rf pulse (see the v log pulse response time section ). v log pulse response time the ADL5506 v log output response for rise and fall times to a given rf input pulse is quickes t for c flt = open ; that is, the only capacitance on the cflt nod e is the internal capacitor . adding off - chip capacitance from the cflt pin to the vlog pin decreas es the video bandwidth and slow s the output response to a n rf input pulse. see the filter capacitor s ection for an approximate closed form equation for the v log video bandwidth. figure 28 shows the response time when the enbl pin is pulse d while having the vpos pin connect to a 3.0 v supply and an rf signal applied at rfin. the sharp pulse that is seen on vlog preceding the ac tual response of the detectors , which happens approximately 0.5 s later , is the power - up transient that occurs in the output stage . the upper voltage limit of thes e power - up transients is 2.25 v typical , for a 3.0 v supply . ensure that these power - up tran sients do not overload the circuit that the vlog pin drives. device handling the wafer level chip scale package consists of solder bumps connected to the active side of the die. the device is lead - free with 95.5% tin, 4.0% silver, and 0.5% copper solder bump comp osition. the wlcsp package can be mounted on printed circuit boards using standard surface - mount assembly techniques; however, take caution to avoid damaging the die. see the an - 617 appl ication note for additional information. wlcsp devices are bumped die, and exposed die can be sensitive to light conditions, which can influence specified limits.
ADL5506 data sheet rev. a | page 22 of 23 evaluation board figure 51 shows the schematic of the ADL5506 evaluation board. the board is powered by a single supply in the 2.5 v to 5.5 v range. the power supply is decoupled by 100 pf and 0.1 f capacitors. enable the device by switching sw1 to the on position. the rf input has a broadband match of 50 using a single 52.3 resistor at r7. more precise matching at spot frequencies is possible (see the input coupling options section). table 6 details the various configuration options of the evaluation board. figure 52 shows the layout of the evaluation board. land pattern and soldering information pad diameters of 0.20 mm are recommended with a solder mask opening of 0.30 mm. for the rf input trace, a trace width of 0.30 mm is used, which corresponds to a 50 characteristic impedance for the dielectric material being used (fr4). all traces going to the pads are tapered down to 0.15 mm. for the rfin line, the length of the tapered section is 0.20 mm. figure 51. evaluation board schematic figure 52. layout of evaluation board, component side table 6. evaluation board configuration options component description default condition vpos, gnd ground and supply vector pins. not applicable c1, c2, c5, c6, c7, c8, c9 power supply decoupling. nominal supply decoupling of 0.1 f and 100 pf. c1, c6 = 100 pf (size 0402), c2, c5, c9 = 0.1 f (size 0402), c7 = c8 = open (size 0805) r7 rf input interface. the 52.3 resistor at r7 combines with the ADL5506 internal input impedance to give a broadband in put impedance of around 50 . r7 = 52.3 (size 0402) c3, c4, r2, r3 output filtering. the combination of the internal 100 output resistance and c4 produce a low-pass filter to reduce the output rippl e of the vlog output. the output can be scaled down using the resistor divider pads, r2 and r3. r3 = 0 (size 0402), r2 = open (size 0402), c3, c4 = open (size 0402) sw1, r4, r10, p2 device enable. when sw1 is set to the on position, the enbl pin is connected to the supply and the ADL5506 is in enable mode. when sw1 i set to the off position, the enbl pin is grounded (through the 0 resistor), putting the device in power-down mode. r4 = 0 (size 0402), r10 = open (size 0402), sw1= on position, p2 = not installed p1, r1, r5, r6, r8, r9 alternate interface. the end connector, p1, allows access to various ADL5506 signals. these signal paths are only used during factory test and characterization. p1 = not installed, r1, r5, r6, r9 = open (size 0402), r8 = open (size 0805) ADL5506 c8 (open) vpos vlog enbl 1 vlog comm 2 3 cflt 6 vpos 5 rfin 4 c7 (open) rfin (p1 ? b6) (p1 ? b8) (p1 ? b12) (p1 ? a1, b1) (p1 ? b4) en r5 (open) r3 0 ? r2 (open) r9 (open) c4 (open) c1 100pf c2 0.1f c9 0.1f vp c5 0.1f c6 100pf c3 (open) r7 52.3 ? r6 (open) r1 (open) vp vp sw1 r8 (open) r10 (open) p2 r4 0 ? 11768-055 11768-056
data sheet ADL5506 rev. a | page 23 of 23 outline dimensions figure 53 . 6 - ball wafer level chip scale package [wlcsp] (cb - 6 - 14) dimensions shown in millimeters ordering guide model 1 temperature range package description package option branding ordering quantity ADL5506acbz - r 7 ? 40c to +85c 6 - ball wafer level chip scale package [wlcsp], 7 tape and reel cb - 6 - 14 ce 3,000 ADL5506 - evalz evaluation board 1 z = rohs compliant part. 10-22-2013- a a b c 0.560 0.500 0.440 0.330 0.300 0.270 0.230 0.200 0.170 0.830 0.790 0.750 1.230 1.190 1.150 1 2 bot t om view (bal l side up) t op view (bal l side down) side view 0.300 0.260 0.220 0.80 ref 0.40 bsc bal l a1 identifier sea ting plane 0.40 bsc coplanarity 0.05 pkg-001265 ? 2013 C 2017 analog devices, inc. all rights reserved. trademarks and registered trademarks are the property of their respective owners. d11768 - 0 - 3/17(a)


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